In Situ Nanomechanical Testing of Crystalline Nanowires in Electron Microscopes
نویسنده
چکیده
This article reviews in situ mechanical testing of crystalline nanowires in scanning and transmission electron microscopes, focusing on bottom–up synthesized, single-crystalline nanowires. Major experimental methods including resonance, bending, tension and buckling are summarized. In addition to commonly encountered experimental issues, deformation mechanisms learned from the in situ nanomechanical characterization are discussed highlighting the roles of free surfaces, internal planar defects and point defects.
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